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RPR-14-00 FRI 15;51 SHEPHERD MILLER IN: F1X N0. 970223i!71 P, 03 <br />/n - ~'L <br />ALPHA/BETA ANALYSIS RESULTS SUI9QARY <br />Method 9D0.0,~y310 (McdifiCd) <br />Lab Name: Paragon. Analytics. Inc. <br />Client Name: Sheph®rd Miller, inf. <br />Client Projact i:.: Bathe T4o~_in*_atr_ C,c:Ld <br />Lab Samp1E ID Series: 00-G3-022 <br />Analyzed by MCG <br />Date Col'_ected; 02/29/2000 <br />Date Analyzed 03%26('L000 <br />Sample Matri: Wafer <br />Count Duraticn: 5~0 Min. <br /> <br />Client Sample iD Gross A1pna morass Seta <br />Lab Samp)_c T_D ~~lpCi/liter? (pCi/liteZ') <br />lo'7D7 000225BMG0 ~ OC-03-C22-C1 I 46.9 ± 3.4 ~ 13.9 a 4.9 <br />16711 000229&MGO I QO-03-022-02 ~I < 2.7S8DL) fl 3,~> t Z.0 ~ <br />' Reported Uncertainties are the Estimated Total Propagated 3ncer~aiaties .20) <br />See PAI SOP7a3R1 for TPU deterninatioas. <br />These Samples were prerared using PAI EGP702R12 <br />an3 analyzed using 2AI SOF72iR3. <br />BDL = Below Detection Limit; see method fir DL de*_ermiaatioi~ <br />00003 <br />,,, <br />