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EXPERIMENTAL METHOD <br /> The 2 samples of Project #: 2102 (112) were reduced to the optimum grain-size range for <br /> quantitative X-ray analysis (<10 µm) by grinding under ethanol in a vibratory McCrone XRD <br /> Mill (Retsch GmbH, Germany) for 10 minutes. Continuous-scan X-ray powder-diffraction data <br /> were collected over a range 3-80°20 with CoKa radiation on a Bruker D8 Advance Bragg- <br /> Brentano diffractometer equipped with an Fe filter foil, 0.6 mm (0.3°) divergence slit, incident- <br /> and diffracted-beam Soller slits and a LynxEye-XE detector. The long fine-focus Co X-ray tube <br /> was operated at 35 kV and 40 mA, using a take-off angle of 6°. <br /> RESULTS <br /> The X-ray diffractograms were analyzed using the International Centre for Diffraction <br /> Database PDF-4 and Search-Match software by Bruker. X-ray powder-diffraction data of the <br /> samples were refined with Rietveld program Topas 4.2 (Bruker AXS). The results of quantitative <br /> phase analysis by Rietveld refinements are given in Table 1. These amounts represent the <br /> relative amounts of crystalline phases normalized to 100%. The Rietveld refinement plots are <br /> shown in Figures 1 and 2. <br /> Note that Figures 1 and 2 show the presence of some amorphous and/or nanoscale material <br /> that was accounted fitting the pattern with a broad calculated peak at about 31 '20 (indicated by <br /> vertical blue line)which could not be refined and measured. <br />